Contents
2024
Volume: 1 Issue 1
7 Article(s)

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Editorial
A new venue to publish and promote high-quality work in the field of imaging
Sylvain Gigan, and Xiaopeng Shao
Advanced Imaging
  • Publication Date: Jul. 18, 2024
  • Vol. 1, Issue 1, 010001 (2024)
Research Article
Video-level and high-fidelity super-resolution SIM reconstruction enabled by deep learning
Hanchu Ye, Zitong Ye, Yunbo Chen, Jinfeng Zhang, Xu Liu, Cuifang Kuang, Youhua Chen, and Wenjie Liu
Structure illumination microscopy (SIM) imposes no special requirements on the fluorescent dyes used for sample labeling, yielding resolution exceeding twice the optical diffraction limit with low phototoxicity, which is therefore very favorable for dynamic observation of live samples. However, the traditional SIM algo
Advanced Imaging
  • Publication Date: Apr. 05, 2024
  • Vol. 1, Issue 1, 011001 (2024)
High-resolution 3D imaging through dense camouflage nets using single-photon LiDAR
Peng-Yu Jiang, Zheng-Ping Li, Wen-Long Ye, Ziheng Qiu, Da-Jian Cui, and Feihu Xu
The single-photon sensitivity and picosecond time resolution of single-photon light detection and ranging (LiDAR) can provide a full-waveform profile for retrieving the three-dimentional (3D) profile of the target separated from foreground clutter. This capability has made single-photon LiDAR a solution for imaging thr
Advanced Imaging
  • Publication Date: May. 15, 2024
  • Vol. 1, Issue 1, 011003 (2024)
Label-free super-resolution stimulated Raman scattering imaging of biomedical specimens
Julien Guilbert, Awoke Negash, Simon Labouesse, Sylvain Gigan, Anne Sentenac, and Hilton B. de Aguiar
Advanced Imaging
  • Publication Date: Jun. 11, 2024
  • Vol. 1, Issue 1, 011004 (2024)
Snapshot macroscopic Fourier ptychography: far-field synthetic aperture imaging via illumination multiplexing and camera array acquisition | On the Cover
Sheng Li, Bowen Wang, Haitao Guan, Guoan Zheng, Qian Chen, and Chao Zuo
Fourier ptychography (FP) is an advanced computational imaging technique that offers high resolution and a large field of view for microscopy. By illuminating the sample at varied angles in a microscope setup, FP performs phase retrieval and synthetic aperture construction without the need for interferometry. Extending
Advanced Imaging
  • Publication Date: Jun. 06, 2024
  • Vol. 1, Issue 1, 011005 (2024)
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