• Journal of Radiation Research and Radiation Processing
  • Vol. 42, Issue 1, 010301 (2024)
Chao TANG1, Ting WANG2, Xuerui WANG1, Minghui CHEN3, and Changlong CAI1、*
Author Affiliations
  • 1School of Optoelectronic Engineering, Xi'an University of Technology, Xi'an 710021, China
  • 2College of Food and Biological Engineering, Shaanxi University of Science & Technology, Xi'an 710021, China
  • 3China Northern Vehicle Research Institute, Beijing 100072, China
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    DOI: 10.11889/j.1000-3436.2023-0084 Cite this Article
    Chao TANG, Ting WANG, Xuerui WANG, Minghui CHEN, Changlong CAI. Genetic evolution of 16S rRNA in Escherichia coli induced by low-energy N+ implantation[J]. Journal of Radiation Research and Radiation Processing, 2024, 42(1): 010301 Copy Citation Text show less
    Structure of 16S rRNA gene in antibiotic-resistant E.coli byN+ ion implantation
    Fig. 1. Structure of 16S rRNA gene in antibiotic-resistant E.coli byN+ ion implantation
    Phylogenetic tree of antibiotic-resistant E.coli byN+ implantation
    Fig. 2. Phylogenetic tree of antibiotic-resistant E.coli byN+ implantation
    Prediction of 2D structure of C region of antibiotic-resistant E.coli byN+ implantation
    Fig. 3. Prediction of 2D structure of C region of antibiotic-resistant E.coli byN+ implantation
    Prediction of 2D structure of V region of antibiotic-resistant E.coli byN+ implantation
    Fig. 4. Prediction of 2D structure of V region of antibiotic-resistant E.coli byN+ implantation
    Venn analysis of antibiotic-resistant genes in antibiotic-resistant E.coli
    Fig. 5. Venn analysis of antibiotic-resistant genes in antibiotic-resistant E.coli
    Antibiotic-resistant analysis of 16S rRNA antibiotic-resistant E.coliPB: polymyxin B, CIP: ciprofloxacin, OFX: ofloxacin, NOR: norfloxacin, LEV: levofloxacin, N: neomycin, AK: amikacin, GM: gentamicin, K: kanamycin, CTR: ceftriaxone, CAZ: ceftazidime, CXM: cefuroxime, CZ: cefazolin, CB: carbenicillin, AM: ampicillin, tetracycline: TE, minocycline: MI, doxycycline: DX, C: chloramphenicol, FZ: furazolidone
    Fig. 6. Antibiotic-resistant analysis of 16S rRNA antibiotic-resistant E.coli

    PB: polymyxin B, CIP: ciprofloxacin, OFX: ofloxacin, NOR: norfloxacin, LEV: levofloxacin, N: neomycin, AK: amikacin, GM: gentamicin, K: kanamycin, CTR: ceftriaxone, CAZ: ceftazidime, CXM: cefuroxime, CZ: cefazolin, CB: carbenicillin, AM: ampicillin, tetracycline: TE, minocycline: MI, doxycycline: DX, C: chloramphenicol, FZ: furazolidone

    组别

    Groups

    存活菌株

    Survival number

    存活率 / %

    Survival rate

    耐药菌株数(突变率 / %)

    Number of antibiotic-resistant E.coli (mutation rate)

    NOR+PB+SM+
    11 72817.284(0.231)2(0.116)0
    21 47214.7207(0.476)0
    31 59715.9702(0.125)10(0.626)
    合计 Total4 79715.994(0.083)11(0.229)10(0.208)
    对照组Control group39 04296.801(0.003)0
    Table 1. Mutation survival rate and mutation rate of antibiotic-resistant E.coli byN+ implantation

    组别

    Groups

    长度 / bp

    Length

    同源性 / %

    Homology

    耐药菌株比例 / %

    Proportion of antibiotic-

    resistant E.coli

    NOR+株比例 / %

    Proportion of NOR+

    PB+株比例 / %

    Proportion of PB+

    SM+株比例 / %

    Proportion of SM+

    ATCC259221 53010080 (20/25)4(1/25)40(10/25)36(9/25)
    EC-N41 26499.54(1/25)4(1/25)00
    EC-N3290899.44(1/25)4(1/25)00
    EC-N351 44499.54(1/25)4(1/25)00
    ECD-S341 25499.54(1/25)004(1/25)
    ECD-P91 45999.64(1/25)04(1/25)0
    Table 2. Characteristics of 16S rRNA gene in antibiotic-resistant E.coli byN+ ion implantation

    类别

    Groups

    A%T%C%G%CG%
    ATCC2592225.1020.2031.8322.8854.71
    EC-N425.0020.1731.5723.2654.83
    EC-N3225.0019.3832.9322.6955.62
    EC-N3524.9320.0831.9922.9954.99
    ECD-S3425.2819.8632.3022.5754.86
    ECD-P924.8120.2931.9422.9654.90
    Table 3. GC% analysis of 16S rRNA gene of antibiotic-resistant E.coli byN+ ion implantation
    Chao TANG, Ting WANG, Xuerui WANG, Minghui CHEN, Changlong CAI. Genetic evolution of 16S rRNA in Escherichia coli induced by low-energy N+ implantation[J]. Journal of Radiation Research and Radiation Processing, 2024, 42(1): 010301
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