• Infrared and Laser Engineering
  • Vol. 51, Issue 9, 20210954 (2022)
Chenguang Zhang, Heng An, Yi Wang, and Zhou Cao
Author Affiliations
  • Lanzhou Institute of Physics, National Key Laboratory of Materials Behavior and Evaluation Technology in Space Environment, Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou 730000, China
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    DOI: 10.3788/IRLA20210954 Cite this Article
    Chenguang Zhang, Heng An, Yi Wang, Zhou Cao. Contrast of single-photon and two-photon absorption-induced charges in laser-simulated single event effects[J]. Infrared and Laser Engineering, 2022, 51(9): 20210954 Copy Citation Text show less
    Diagram of single- and two-photon absorption
    Fig. 1. Diagram of single- and two-photon absorption
    Charge tracks generated by SPA and TPA
    Fig. 2. Charge tracks generated by SPA and TPA
    LM741 CH operational amplifier
    Fig. 3. LM741 CH operational amplifier
    Influence of 1064 nm pulse laser energy variation on response voltage of LM741 CH operational amplifier
    Fig. 4. Influence of 1064 nm pulse laser energy variation on response voltage of LM741 CH operational amplifier
    Influence of 1200 nm pulse laser energy variation on response voltage of LM741 CH operational amplifier
    Fig. 5. Influence of 1200 nm pulse laser energy variation on response voltage of LM741 CH operational amplifier
    Fitting diagram of linear relationship between single-photon (two-photon) voltage response and energy (energy square)
    Fig. 6. Fitting diagram of linear relationship between single-photon (two-photon) voltage response and energy (energy square)
    Fitting diagram of linear relation between charge amount of single-photon (two-photon) and energy (energy square)
    Fig. 7. Fitting diagram of linear relation between charge amount of single-photon (two-photon) and energy (energy square)
    Chenguang Zhang, Heng An, Yi Wang, Zhou Cao. Contrast of single-photon and two-photon absorption-induced charges in laser-simulated single event effects[J]. Infrared and Laser Engineering, 2022, 51(9): 20210954
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