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Vol. 3, Issue 3, 100097 (2024)

Measurement of cryoelectronics heating using a local quantum dot thermometer in silicon

Mathieu de Kruijf^1、2、*, Grayson M. Noah¹, Alberto Gomez-Saiz¹, John J.L. Morton^1、2, and M. Fernando Gonzalez-Zalba¹

Author Affiliations

¹Quantum Motion, London N7 9HJ, United Kingdom

²London Centre for Nanotechnology, University College London, London WC1H 0AH, United Kingdom

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DOI: 10.1016/j.chip.2024.100097 Cite this Article

Mathieu de Kruijf, Grayson M. Noah, Alberto Gomez-Saiz, John J.L. Morton, M. Fernando Gonzalez-Zalba. Measurement of cryoelectronics heating using a local quantum dot thermometer in silicon[J]. Chip, 2024, 3(3): 100097 Copy Citation Text

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References

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Mathieu de Kruijf, Grayson M. Noah, Alberto Gomez-Saiz, John J.L. Morton, M. Fernando Gonzalez-Zalba. Measurement of cryoelectronics heating using a local quantum dot thermometer in silicon[J]. Chip, 2024, 3(3): 100097

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