• Optoelectronic Technology
  • Vol. 44, Issue 2, 168 (2024)
Yong ZHANG, Lin LI, Ju REN, Fan LI, Lin PENG, and Panqiang WU
Author Affiliations
  • Chengdu BOE Display Sci‑tech Co., Ltd.,Chengdu 610299,CHN
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    DOI: 10.12450/j.gdzjs.202402015 Cite this Article
    Yong ZHANG, Lin LI, Ju REN, Fan LI, Lin PENG, Panqiang WU. Improvement of Color Deviation Based on SUVA Process[J]. Optoelectronic Technology, 2024, 44(2): 168 Copy Citation Text show less
    Schematic of alignment principle of UV²A process and SUVA3 process
    Fig. 1. Schematic of alignment principle of UV²A process and SUVA3 process
    Diagram of the CR(80/20) data angle measurement
    Fig. 2. Diagram of the CR(80/20) data angle measurement
    The CR(80/20) measured with UV²A process and SUVA3 process
    Fig. 3. The CR(80/20) measured with UV²A process and SUVA3 process
    Schematic of -30°luminance of UV²A process and SUVA3 process
    Fig. 4. Schematic of -30°luminance of UV²A process and SUVA3 process
    Schematic of + 30°luminance of UV²A process and SUVA3 process
    Fig. 5. Schematic of + 30°luminance of UV²A process and SUVA3 process
    Schematic of 0°luminance of UV²A process and SUVA3 process
    Fig. 6. Schematic of 0°luminance of UV²A process and SUVA3 process
    Schematic of azimuth angle of UV²A process and SUVA3 process
    Fig. 7. Schematic of azimuth angle of UV²A process and SUVA3 process
    Schematic of the synthetic exposure process
    Fig. 8. Schematic of the synthetic exposure process
    The azimuth angle measured with different horizontal exposure energies
    Fig. 9. The azimuth angle measured with different horizontal exposure energies
    The CR(80/20) measured with different horizontal exposure energies
    Fig. 10. The CR(80/20) measured with different horizontal exposure energies
    The azimuth angle measured with different WGP angles
    Fig. 11. The azimuth angle measured with different WGP angles
    The CR(80/20) measured with different WGP angles
    Fig. 12. The CR(80/20) measured with different WGP angles
    The azimuth angle measured with different ITO slit angles
    Fig. 13. The azimuth angle measured with different ITO slit angles
    The CR(80/20)measured with different ITO slit angles
    Fig. 14. The CR(80/20)measured with different ITO slit angles
    The results of the color deviation improvement
    Fig. 15. The results of the color deviation improvement
    Yong ZHANG, Lin LI, Ju REN, Fan LI, Lin PENG, Panqiang WU. Improvement of Color Deviation Based on SUVA Process[J]. Optoelectronic Technology, 2024, 44(2): 168
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