Deep-UV fluorescence lifetime imaging microscopy

Christiaan J. de Jong; Alireza Lajevardipour; Mindaugas Gecevi?ius; Martynas Beresna; Gediminas Gervinskas; Peter G. Kazansky; Yves Bellouard; Andrew H. A. Clayton; Saulius Juodkazis

doi:10.1364/prj.3.000283

Journals >Photonics Research >Volume 3 >Issue 5 >Page 283 > Article

Photonics Research
Vol. 3, Issue 5, 283 (2015)

Deep-UV fluorescence lifetime imaging microscopy

Christiaan J. de Jong^1、2, Alireza Lajevardipour¹, Mindaugas Gecevi?ius³, Martynas Beresna³, Gediminas Gervinskas^1、4, Peter G. Kazansky³, Yves Bellouard⁵, Andrew H. A. Clayton¹, and Saulius Juodkazis^{1、4、6、*}

Author Affiliations

¹Centre for Micro-Photonics, Faculty of Science, Engineering and Technology, Swinburne University of Technology,Hawthorn, VIC 3122, Australia

²Department of Mechanical Engineering, Eindhoven University of Technology,Postbus 513, 5600MB Eindhoven, The Netherlands

³Optoelectronics Research Centre, University of Southampton, Southampton, SO17 1BJ, UK

⁴Melbourne Centre for Nanofabrication, 151 Wellington Road, Clayton, VIC 3168, Australia

⁵Ecole Polytechnique Fédérale de Lausanne, Rue de la Maladiére 71b, CH—2002 Neuchatel, Switzerland

⁶Center for Nanotechnology, King Abdulaziz University, Jeddah 21589, Saudi Arabia

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DOI: 10.1364/prj.3.000283 Cite this Article Set citation alerts

Christiaan J. de Jong, Alireza Lajevardipour, Mindaugas Gecevi?ius, Martynas Beresna, Gediminas Gervinskas, Peter G. Kazansky, Yves Bellouard, Andrew H. A. Clayton, Saulius Juodkazis, "Deep-UV fluorescence lifetime imaging microscopy," Photonics Res. 3, 283 (2015) Copy Citation Text

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Abstract

A novel fluorescence lifetime imaging microscopy (FLIM) working with deep UV 240–280 nm wavelength excitations has been developed. UV-FLIM is used for measurement of defect-related fluorescence and its changes upon annealing from femtosecond laser-induced modifications in fused silica. This FLIM technique can be used with microfluidic and biosamples to characterize temporal characteristics of fluorescence upon UV excitation, a capability easily added to a standardmicroscope-based FLIM. UV-FLIMwas tested to show annealing of the defects induced by silica structuringwith ultrashort laser pulses. Frequency-domain fluorescencemeasurementswere converted into the time domain to extract long fluorescence lifetimes from defects in silica.

Keywords

Laser materials processing Microscopy Ultraviolet