• Journal of Applied Optics
  • Vol. 45, Issue 3, 537 (2024)
Wanhong YIN1、*, Zaitian DONG1, Yunlong ZHANG1, Wentao WANG2, Lei LIU2, Haoyuan CHEN1, Yuanyuan DUAN1, Lei WU1, Gaoping LI1, Dongyu YU1, Pei WU1, Bing YU1, and Pengcheng SUN1
Author Affiliations
  • 1Primary Optical Metrology Station of National Defense Science and Technology Industry, Xi'an Institute of Applied Optics, Xi'an 710065, China
  • 2Key Laboratory of Solid-State Laser Technology, The 11th Research Institute of China Electronics Technology Group Corporation, Beijing 100020, China
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    DOI: 10.5768/JAO202445.0310007 Cite this Article
    Wanhong YIN, Zaitian DONG, Yunlong ZHANG, Wentao WANG, Lei LIU, Haoyuan CHEN, Yuanyuan DUAN, Lei WU, Gaoping LI, Dongyu YU, Pei WU, Bing YU, Pengcheng SUN. Measurement method of beam quality factor β for high energy laser[J]. Journal of Applied Optics, 2024, 45(3): 537 Copy Citation Text show less

    Abstract

    The measurement system of high energy laser beam quality factor β is mainly used for state debugging and comprehensive performance parameters diagnosis of laser system, while these parameters can evaluate the laser output performance and the far-field spot focusing ability of the laser system. Aiming at the defect that the beam quality factor β close to the diffraction limit occupying too few pixels in the area array detectors, a measurement method was proposed based on microscopic magnification with high-precision scanning slit, and the relevant scheme was analyzed and calculated. In addition, a verification scheme of measurement results using the combination of fixed aberration elements and collimator light sources was designed to analyze the uncertainty of measuring device of developed high energy laser beam quality factor β, and the measurement uncertainty was better than 10%.
    Wanhong YIN, Zaitian DONG, Yunlong ZHANG, Wentao WANG, Lei LIU, Haoyuan CHEN, Yuanyuan DUAN, Lei WU, Gaoping LI, Dongyu YU, Pei WU, Bing YU, Pengcheng SUN. Measurement method of beam quality factor β for high energy laser[J]. Journal of Applied Optics, 2024, 45(3): 537
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