Journals
Advanced Photonics
Photonics Insights
Advanced Photonics Nexus
Photonics Research
Advanced Imaging
View All Journals
Chinese Optics Letters
High Power Laser Science and Engineering
Articles
Optics
Physics
Geography
View All Subjects
Conferences
CIOP
HPLSE
AP
View All Events
News
About CLP
Search by keywords or author
Login
Registration
Login in
Registration
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
Journals >
Advanced Photonics >
Volume 1 >
Issue 5 >
Page 056003 > Article
Advanced Photonics
Vol. 1, Issue 5, 056003 (2019)
Resolution limit of label-free far-field microscopy
Evgenii Narimanov
*
Author Affiliations
Purdue University, School of Electrical Engineering, Birck Nanotechnology Center, West Lafayette, Indiana, United States
show less
DOI:
10.1117/1.AP.1.5.056003
Cite this Article
Set citation alerts
Evgenii Narimanov, "Resolution limit of label-free far-field microscopy," Adv. Photon. 1, 056003 (2019)
Copy Citation Text
EndNote(RIS)
BibTex
Plain Text
show less
Cited By
Article index updated: Apr. 13, 2025
Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
The article is cited by
34
article(s) from Web of Science.
The article is cited by
1
article(s) CLP online library. (Some content might be in Chinese.)
Full Text
Get PDF
Figures&Tables (3)
Equations (27)
References (38)
Cited By (34)
Get Citation
Copy Citation Text
Evgenii Narimanov, "Resolution limit of label-free far-field microscopy," Adv. Photon. 1, 056003 (2019)
Download Citation
EndNote(RIS)
BibTex
Plain Text
Set citation alerts for the article
Tools
Share
Set citation alerts for the article
Save the article for my favorites
Paper Information
Category: Research Articles
Received: Sep. 17, 2019
Accepted: Oct. 15, 2019
Published Online: Nov. 1, 2019
The Author Email: Narimanov Evgenii (evgenii@purdue.edu)
DOI:
10.1117/1.AP.1.5.056003
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology
Set citation alerts for the article
Please enter your email address
Cancel
Confirm