XIONG Huabing, LI Jinlong, HU Qiong, ZHAO Guanghui, ZHANG Wenfeng, TAN Kankan. Research on Bond Strength Decay of Wire Bonding Under Temperature Cycling[J]. Microelectronics, 2023, 53(2): 355

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- Microelectronics
- Vol. 53, Issue 2, 355 (2023)
Abstract

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