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    Journals >Optoelectronic Technology >Volume 39 >Issue 2 >Page 123 > Article
    • Optoelectronic Technology
    • Vol. 39, Issue 2, 123 (2019)
    Mechanism and Improvement on High Temperature Crosstalk in Vehicle TFT LCD Devices Reliability Test
    SU Lei*, YANG Xiaofei, LI Xinghua, LIU Xu, MOU Xun, and MENG Jia
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    DOI: 10.19453/j.cnki.1005-488x.2019.02.011 Cite this Article
    SU Lei, YANG Xiaofei, LI Xinghua, LIU Xu, MOU Xun, MENG Jia. Mechanism and Improvement on High Temperature Crosstalk in Vehicle TFT LCD Devices Reliability Test[J]. Optoelectronic Technology, 2019, 39(2): 123 Copy Citation Text show less
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    SU Lei, YANG Xiaofei, LI Xinghua, LIU Xu, MOU Xun, MENG Jia. Mechanism and Improvement on High Temperature Crosstalk in Vehicle TFT LCD Devices Reliability Test[J]. Optoelectronic Technology, 2019, 39(2): 123
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