Short-circuit failure modes and mechanism investigation of 1200 V planar SiC MOSFETs

Yi Huang; Qiurui Chen; Rongyao Ma; Kaifeng Tang; Qi Wang; Hongsheng Zhang; Ji Ding; Dandan Xu; Sheng Gao; Genquan Han

doi:10.1088/1674-4926/24060009

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