• Piezoelectrics & Acoustooptics
  • Vol. 46, Issue 6, 990 (2024)
ZHOU Yangzhou, ZHANG Zehong, HE Xiaoliang, and XIE Qiang
Author Affiliations
  • The 26th Institute of China Electronics Technology Group Corporation, Chongqing 400060, China
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    DOI: 10.11977/j.issn.1004-2474.2024.06.025 Cite this Article
    ZHOU Yangzhou, ZHANG Zehong, HE Xiaoliang, XIE Qiang. Design and Process of 2.7 μm Diametry Film[J]. Piezoelectrics & Acoustooptics, 2024, 46(6): 990 Copy Citation Text show less

    Abstract

    This paper addresses the coating requirements for 2.7 μm acousto-optic Q-switches and details the design, fabrication process, and performance testing of 2.7 μm anti-reflective coatings. The substrate material for the 2.7 μm anti-reflective coating is lithium niobate crystal, with hafnium oxide selected as the high-refractive-index material and ytterbium fluoride as the low-refractive-index material. A four-layer narrowband high-transmittance film design was employed in this study. The resulting samples exhibited a transmittance of 98.6% at a wavelength of 2.7 μm. The coated samples maintained their stable performance after 48 h of high- and low-temperature experiments and 24 h of immersion in common solvents such as acetone and anhydrous ethanol.
    ZHOU Yangzhou, ZHANG Zehong, HE Xiaoliang, XIE Qiang. Design and Process of 2.7 μm Diametry Film[J]. Piezoelectrics & Acoustooptics, 2024, 46(6): 990
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