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X-ray Optics|33 Article(s)
Optical characterization of X-ray polymer refractive lenses using a microfocus X-ray grating interferometer
Dongxu Qin, Lian Xue, Yifan Ding, Ziwen Huang, Lei Yang, Zhaofeng Kang, Keyi Wang, and Shuai Zhao
Two-photon polymerization lithography is a technique that provides hundreds of nanometer resolution and full geometric freedom. Several X-ray polymer refractive lenses created by this technique were characterized using differential phase contrast imaging (DPCI) with a microfocus X-ray grating interferometer. The beam deflection angle and wavefront phase shift of the X-ray beam through the lens were obtained. Comparative tests using synchrotron radiation sources showed that the system could measure the surface shape of X-ray refractive lenses with an accuracy of 0.4 µm. This study is important for improving the fabrication process and focusing performance of X-ray refractive lenses. Two-photon polymerization lithography is a technique that provides hundreds of nanometer resolution and full geometric freedom. Several X-ray polymer refractive lenses created by this technique were characterized using differential phase contrast imaging (DPCI) with a microfocus X-ray grating interferometer. The beam deflection angle and wavefront phase shift of the X-ray beam through the lens were obtained. Comparative tests using synchrotron radiation sources showed that the system could measure the surface shape of X-ray refractive lenses with an accuracy of 0.4 µm. This study is important for improving the fabrication process and focusing performance of X-ray refractive lenses.
Chinese Optics Letters
- Publication Date: Apr. 10, 2025
- Vol. 23, Issue 4, 043401 (2025)
Component and performance evolution of Zr filters induced by annealing and synchrotron radiation in EUV range
Jingtao Zhu, Sheng Guo, Jiaoling Zhao, Xiaoran Li, Jianda Shao, Hongjun Zhou, and Tonglin Huo
Freestanding Zr filters are important devices for improving spectral purity in the extreme ultraviolet range of 7–20 nm, and their irradiation resistance directly determines their life and efficiency. We prepared multilayered Zr/B4C and Zr/Si filters using magnetron sputtering. Their transmittance reached a maximum of 23% (λ = 13.5 nm). Microwatt-radiation-induced structural changes in the filters were investigated at the metrology beamline (BL08B) of the National Synchrotron Radiation Laboratory. The aging of the Zr filters was measured and analyzed. The experimental results revealed that the damage was noticeable on the irradiated filter surfaces with different states, suggesting that the main factors causing the degradation of the filters were oxidation and carbon contamination at the surfaces. Furthermore, the thermal stability of the Zr filters was studied by annealing, and the heat accumulation during the damage process was estimated using finite-element numerical simulations and X-ray photoelectron spectroscopy measurements. Silicide formation at the Zr-Si-O system interfaces was found to be key to enhancing the stability of the filters. Freestanding Zr filters are important devices for improving spectral purity in the extreme ultraviolet range of 7–20 nm, and their irradiation resistance directly determines their life and efficiency. We prepared multilayered Zr/B4C and Zr/Si filters using magnetron sputtering. Their transmittance reached a maximum of 23% (λ = 13.5 nm). Microwatt-radiation-induced structural changes in the filters were investigated at the metrology beamline (BL08B) of the National Synchrotron Radiation Laboratory. The aging of the Zr filters was measured and analyzed. The experimental results revealed that the damage was noticeable on the irradiated filter surfaces with different states, suggesting that the main factors causing the degradation of the filters were oxidation and carbon contamination at the surfaces. Furthermore, the thermal stability of the Zr filters was studied by annealing, and the heat accumulation during the damage process was estimated using finite-element numerical simulations and X-ray photoelectron spectroscopy measurements. Silicide formation at the Zr-Si-O system interfaces was found to be key to enhancing the stability of the filters.
Chinese Optics Letters
- Publication Date: Mar. 12, 2025
- Vol. 23, Issue 3, 033401 (2025)
Angle measurement of pulsars based on spatially modulated X-ray intensity correlation
De Wang, Hong Yu, Zhijie Tan, Ronghua Lu, and Shensheng Han
High-precision angle measurement of pulsars is critical for realizing pulsar navigation. Compared to visible light and radio waves, the wavelength of X-rays is incredibly short, which provides the possibility of achieving better spatial resolution. However, due to the lack of applicable X-ray apparatus, extracting the angle information of pulsars through conventional X-ray methods is challenging. Here, we propose an approach of pulsar angle measurement based on spatially modulated X-ray intensity correlation (SMXIC), in which the angle information is obtained by measuring the spatial intensity correlation between two radiation fields. The theoretical model for this method has been established, and a proof-of-concept experiment was carried out. The SMXIC measurement of observing angles has been demonstrated, and the experimental results are consistent with the theoretical values. The potential of this method in future applications is discussed, and theoretically, the angular measurement at the level of micro-arcsecond can be expected. The sphere of pulsar navigation may benefit from our fresh insights. High-precision angle measurement of pulsars is critical for realizing pulsar navigation. Compared to visible light and radio waves, the wavelength of X-rays is incredibly short, which provides the possibility of achieving better spatial resolution. However, due to the lack of applicable X-ray apparatus, extracting the angle information of pulsars through conventional X-ray methods is challenging. Here, we propose an approach of pulsar angle measurement based on spatially modulated X-ray intensity correlation (SMXIC), in which the angle information is obtained by measuring the spatial intensity correlation between two radiation fields. The theoretical model for this method has been established, and a proof-of-concept experiment was carried out. The SMXIC measurement of observing angles has been demonstrated, and the experimental results are consistent with the theoretical values. The potential of this method in future applications is discussed, and theoretically, the angular measurement at the level of micro-arcsecond can be expected. The sphere of pulsar navigation may benefit from our fresh insights.
Chinese Optics Letters
- Publication Date: Apr. 25, 2024
- Vol. 22, Issue 4, 043401 (2024)
Characterization of single-pulse photon energy and photon energy jitter at the Shanghai soft X-ray Free-Electron Laser
Zichen Gao, Yajun Tong, Yueran Wang, Xinyuan Wang, Pingping Wen, Donghao Lu, Xinye Yuan, Difei Zhang, Jingcheng Xiao, Xiaokai Li, Zhihao Guan, Jiacheng Gu, Yonggan Nie, Zhi Guo, Zhen Wang, Chao Feng, Jiadong Fan, and Huaidong Jiang
The X-ray free-electron laser (XFEL), a new X-ray light source, presents numerous opportunities for scientific research. Self-amplified spontaneous emission (SASE) is one generation mode of XFEL in which each pulse is unique. In this paper, we propose a pinhole diffraction method to accurately determine the XFEL photon energy, pulses’ photon energy jitter, and sample-to-detector distance for soft X-ray. This method was verified at Shanghai soft X-ray Free-Electron Laser (SXFEL). The measured average photon energy was 406.5 eV, with a photon energy jitter (root-mean-square) of 1.39 eV, and the sample-to-detector distance was calculated to be 16.61 cm. The X-ray free-electron laser (XFEL), a new X-ray light source, presents numerous opportunities for scientific research. Self-amplified spontaneous emission (SASE) is one generation mode of XFEL in which each pulse is unique. In this paper, we propose a pinhole diffraction method to accurately determine the XFEL photon energy, pulses’ photon energy jitter, and sample-to-detector distance for soft X-ray. This method was verified at Shanghai soft X-ray Free-Electron Laser (SXFEL). The measured average photon energy was 406.5 eV, with a photon energy jitter (root-mean-square) of 1.39 eV, and the sample-to-detector distance was calculated to be 16.61 cm.
Chinese Optics Letters
- Publication Date: Oct. 09, 2024
- Vol. 22, Issue 10, 103401 (2024)
Effect of delay time between pre-pulse and main pulse on single-pass and double-pass amplification of 46.9 nm laser
Dongdi Zhao, Yongpeng Zhao, Huaiyu Cui, Bo An, Lei Li, and Yunsong Bai
In this paper, the influence of the delay time between the pre-pulse and the main pulse on the double-pass amplified 46.9 nm laser was studied for the first time, to the best of our knowledge, by using a high-precision polished SiC slice as a rear mirror. The temporal and spatial characteristics of the output laser were measured separately to investigate the effect of the delay time on the laser characteristics. The energy of the double-pass amplified laser was between 510 µJ and 890 µJ. In addition, a theoretical model of double-pass amplification was established to analyze the effect of the delay time on the double-pass amplified 46.9 nm laser. In this paper, the influence of the delay time between the pre-pulse and the main pulse on the double-pass amplified 46.9 nm laser was studied for the first time, to the best of our knowledge, by using a high-precision polished SiC slice as a rear mirror. The temporal and spatial characteristics of the output laser were measured separately to investigate the effect of the delay time on the laser characteristics. The energy of the double-pass amplified laser was between 510 µJ and 890 µJ. In addition, a theoretical model of double-pass amplification was established to analyze the effect of the delay time on the double-pass amplified 46.9 nm laser.
Chinese Optics Letters
- Publication Date: Apr. 20, 2023
- Vol. 21, Issue 5, 053401 (2023)
Damage resistance of B4C reflective mirror irradiated by X-ray free-electron laser
Jinyu Cao, Shuhui Li, Yajun Tong, Ming Tang, Wenbin Li, Qiushi Huang, Huaidong Jiang, and Zhanshan Wang
In this paper, a simple theoretical model combining Monte Carlo simulation with the enthalpy method is provided to simulate the damage resistance of B4C/Si-sub mirror under X-ray free-electron laser irradiation. Two different damage mechanisms are found, dependent on the photon energy. The optimum B4C film thickness is determined by studying the dependence of the damage resistance on the film thickness. Based on the optimized film thickness, the damage thresholds are simulated at photon energy of 0.4–25 keV and a grazing incidence angle of 2 mrad. It is recommended that the energy range around the Si K-edge should be avoided for safety reasons. In this paper, a simple theoretical model combining Monte Carlo simulation with the enthalpy method is provided to simulate the damage resistance of B4C/Si-sub mirror under X-ray free-electron laser irradiation. Two different damage mechanisms are found, dependent on the photon energy. The optimum B4C film thickness is determined by studying the dependence of the damage resistance on the film thickness. Based on the optimized film thickness, the damage thresholds are simulated at photon energy of 0.4–25 keV and a grazing incidence angle of 2 mrad. It is recommended that the energy range around the Si K-edge should be avoided for safety reasons.
Chinese Optics Letters
- Publication Date: Oct. 13, 2022
- Vol. 21, Issue 2, 023401 (2023)
High-resolution Mo Kα X-ray monochromatic backlight imaging using a toroidal crystal
Haoxuan Si, Lianqiang Shan, Huiyao Du, Li Jiang, Shengzhen Yi, Weimin Zhou, and Zhanshan Wang
Curved crystal imaging is an important means of plasma diagnosis. Due to the short wavelengths of high-energy X rays and the fixed lattice constant of the spherical crystal, it is difficult to apply the spherical crystal in high-energy X-ray imaging. In this study, we have developed a high-energy, high-resolution X-ray imager based on a toroidal crystal that can effectively correct astigmatism. We prepared a Ge 〈5 1 1〉 toroidal crystal for backlighting Mo Kα1 characteristic lines (∼17.48 keV) and verified its high-resolution imaging ability in high-energy X-ray region, achieving a spatial resolution of 5–10 µm in a field of view larger than 1.0 mm. Curved crystal imaging is an important means of plasma diagnosis. Due to the short wavelengths of high-energy X rays and the fixed lattice constant of the spherical crystal, it is difficult to apply the spherical crystal in high-energy X-ray imaging. In this study, we have developed a high-energy, high-resolution X-ray imager based on a toroidal crystal that can effectively correct astigmatism. We prepared a Ge 〈5 1 1〉 toroidal crystal for backlighting Mo Kα1 characteristic lines (∼17.48 keV) and verified its high-resolution imaging ability in high-energy X-ray region, achieving a spatial resolution of 5–10 µm in a field of view larger than 1.0 mm.
Chinese Optics Letters
- Publication Date: Sep. 06, 2023
- Vol. 21, Issue 10, 103401 (2023)
X-ray volumetric quantitative phase imaging by Foucault differential filtering with linear scanning
Young-Sung Park, Jieun Hong, and Jaeho Choi
Non-interferometric X-ray quantitative phase imaging (XQPI), much simpler than the interferometric scheme, has provided high-resolution and reliable phase-contrast images. We report on implementing the volumetric XQPI images using concurrent-bidirectional scanning of the orthogonal plane on the optical axis of the Foucault differential filter; we then extracted data in conjunction with the transport-intensity equation. The volumetric image of the laminate microstructure of the gills of a fish was successfully reconstructed to demonstrate our XQPI method. The method can perform 3D rendering without any rotational motion for laterally extended objects by manipulating incoherent X-rays using the pinhole array. Non-interferometric X-ray quantitative phase imaging (XQPI), much simpler than the interferometric scheme, has provided high-resolution and reliable phase-contrast images. We report on implementing the volumetric XQPI images using concurrent-bidirectional scanning of the orthogonal plane on the optical axis of the Foucault differential filter; we then extracted data in conjunction with the transport-intensity equation. The volumetric image of the laminate microstructure of the gills of a fish was successfully reconstructed to demonstrate our XQPI method. The method can perform 3D rendering without any rotational motion for laterally extended objects by manipulating incoherent X-rays using the pinhole array.
Chinese Optics Letters
- Publication Date: Sep. 07, 2022
- Vol. 21, Issue 1, 013401 (2023)
Perovskite-quantum-dots activated silica fiber X-ray dosimeter
Yuqing Xie, Yue Jing, Luyue Niu, Ci Wang, Lei Zhao, Jing Ren, and Jianzhong Zhang
A new type of X-ray fiber dosimeters is proposed that is based on the X-ray response of CsPbBr3 perovskite-quantum-dots (PQDs) activated silica fiber. Such a fiber sensor is constructed by covering a multimode silica fiber with PQDs embedded glass powders using a transparent high-temperature glue. Under X-ray irradiation, the fiber sensor emits bright green light at 525 nm, which can be readily recorded by a CCD spectrometer. The integrated radioluminescence intensity has an excellent linear response to the X-ray dose. Study is given to the fiber sensor concerning its thermal stability in a temperature range of room temperature up to 300°C, resistance to water erosion, and prolonged X-ray irradiation. The results verify that the proposed fiber sensor has the advantages of good thermal stability, chemical durability, and radiation hardness. The studied X-ray fiber sensor holds promise to be used in a real-time, in-situ, and remote radiation dose monitoring. A new type of X-ray fiber dosimeters is proposed that is based on the X-ray response of CsPbBr3 perovskite-quantum-dots (PQDs) activated silica fiber. Such a fiber sensor is constructed by covering a multimode silica fiber with PQDs embedded glass powders using a transparent high-temperature glue. Under X-ray irradiation, the fiber sensor emits bright green light at 525 nm, which can be readily recorded by a CCD spectrometer. The integrated radioluminescence intensity has an excellent linear response to the X-ray dose. Study is given to the fiber sensor concerning its thermal stability in a temperature range of room temperature up to 300°C, resistance to water erosion, and prolonged X-ray irradiation. The results verify that the proposed fiber sensor has the advantages of good thermal stability, chemical durability, and radiation hardness. The studied X-ray fiber sensor holds promise to be used in a real-time, in-situ, and remote radiation dose monitoring.
Chinese Optics Letters
- Publication Date: Apr. 27, 2022
- Vol. 20, Issue 6, 063401 (2022)
Megapixel X-ray ghost imaging with a binned detector in the object arm
Haipeng Zhang, Ke Li, Feixiang Wang, Hong Yu, Changzhe Zhao, Guohao Du, Zhongliang Li, Biao Deng, Honglan Xie, Shensheng Han, and Tiqiao Xiao
At present, reconstruction of megapixel and high-fidelity images with few measurements is a major challenge for X-ray ghost imaging (XGI). The available strategies require massive measurements and reconstruct low-fidelity images of less than 300×300 pixels. Inspired by the concept of synthetic aperture radar, synthetic aperture XGI (SAXGI) integrated with compressive sensing is proposed to solve this problem with a binned detector in the object arm. Experimental results demonstrated that SAXGI can accurately reconstruct the 1200×1200 pixels image of a binary sample of tangled strands of tungsten fiber from 660 measurements. Accordingly, SAXGI is a promising solution for the practical application of XGI. At present, reconstruction of megapixel and high-fidelity images with few measurements is a major challenge for X-ray ghost imaging (XGI). The available strategies require massive measurements and reconstruct low-fidelity images of less than 300×300 pixels. Inspired by the concept of synthetic aperture radar, synthetic aperture XGI (SAXGI) integrated with compressive sensing is proposed to solve this problem with a binned detector in the object arm. Experimental results demonstrated that SAXGI can accurately reconstruct the 1200×1200 pixels image of a binary sample of tangled strands of tungsten fiber from 660 measurements. Accordingly, SAXGI is a promising solution for the practical application of XGI.
Chinese Optics Letters
- Publication Date: Jan. 13, 2022
- Vol. 20, Issue 3, 033401 (2022)
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