• Chinese Optics Letters
  • Vol. 23, Issue 5, (2025)
Han Hailong, Xiong Jiamin, Liu Xiaoping, Li Hao, Xu Hongxin, Huang Jia, YUAN PUSHENG, YU HUIQIN, WANG SHUNA, LI Lingyun, You Lixing
Author Affiliations
  • Shanghai Institute of Microsystem and Information Technology
  • Chinese Academy of Sciences
  • ShanghaiTech University School of Physical Science and Technology
  • Chinese Academy of Sciences (CAS)
  • Shanghai Institute of Microsystem and Information Technology
  • Chinese Acad Sci
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    Abstract

    In this study, we present a comprehensive thermo-optic characterization of an on-chip thin-film lithium niobate asymmetric Mach-Zehnder interferometer (aMZI) across a temperature range from 290 K to 10 K. We observe that the spectral shift of the aMZI is closely associated with changes in the environmental temperature. We experimentally observed a 4.88 nm wavelength shift of the aMZI from 290 K to 10 K. Moreover, the shift diminishes gradually below 50 K. Our observations highlight a distinctive non-linear temperature sensitivity, particularly pronounced at cryogenic temperatures. The high-resolution setup revealed a thermo-optic coefficient as low as 5.29 × 10-8 K-1 at 10 K. The presented results provide new practical guidelines for designing photonic circuits for applications in cryogenic optoelectronics.
    Manuscript Accepted: Nov. 4, 2024
    Posted: Nov. 29, 2024