• Optics and Precision Engineering
  • Vol. 32, Issue 8, 1130 (2024)
Leqian KANG1, Pengcheng YANG1,*, Qiujuan LÜ2, Liping LIAN1,3, and Xindong ZHU4
Author Affiliations
  • 1School of Mechanical and Electrical Engineering, Xi'an Polytechnic University,Xi'an70048, China
  • 2Department of Basic, Rocket Force University of Engineering, Xi'an71005, China
  • 3College of Optoelectronic Engineering, Chongqing University, Chongqing400040, China
  • 4Ministry of Education Key Laboratory for Nonequilibrium Synthesis and Modulation of Condensed Matter, School of Physics, Xi'an Jiaotong University, Xi'an71009, China
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    DOI: 10.37188/OPE.20243208.1130 Cite this Article
    Leqian KANG, Pengcheng YANG, Qiujuan LÜ, Liping LIAN, Xindong ZHU. Wrapping phase repair method based on Tsallis Relative Entropy evaluation[J]. Optics and Precision Engineering, 2024, 32(8): 1130 Copy Citation Text show less

    Abstract

    In the laser interferometric measurement of gear tooth flank topography, the collected wrapped phase map can be influenced by various sources of noise. These areas of poor phase quality in the wrapped phase map can lead to unwrapping errors and reduces measurement accuracy. This paper proposed a wrapped-phase repair method to address the problem. It utilized Tsallis relative entropy as an evaluation criterion, based on the probability distribution characteristics of the interference fringe image. The method first fitted the thresholded image using Gaussian distribution, then evaluated the phase quality by Tsallis relative entropy, finally patched the poor quality regions to improve the quality of phase unwrapped. The experimental results show that the method can reduce the phase residue points by 40% and effectively improve the phase quality. The proposed method is user-friendly and highly accurate. It can be applied to other fields related to phase-shifting optics.
    Leqian KANG, Pengcheng YANG, Qiujuan LÜ, Liping LIAN, Xindong ZHU. Wrapping phase repair method based on Tsallis Relative Entropy evaluation[J]. Optics and Precision Engineering, 2024, 32(8): 1130
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