Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Laser & Optoelectronics Progress >Volume 55 >Issue 3 >Page 031009 > Article
    • Laser & Optoelectronics Progress
    • Vol. 55, Issue 3, 031009 (2018)
    Face Liveness Detection Method Based on Histogram of Oriented Gradient
    Yueping Kong1,*, Xia Liu1, Xinqian Xie1, and Fengjie Li1
    Author Affiliations
  • 1 College of Information and Control Engineering, Xi'an University of Architecture and Technology, Xi'an, Shaanxi 710055, China
  • 1 Tianjin Electronic Information College, Tianjin 300350, China
    • show less
    DOI: 10.3788/LOP55.031009 Cite this Article Set citation alerts
    Yueping Kong, Xia Liu, Xinqian Xie, Fengjie Li. Face Liveness Detection Method Based on Histogram of Oriented Gradient[J]. Laser & Optoelectronics Progress, 2018, 55(3): 031009 Copy Citation Text show less
    Cited By
    Article index updated: Mar. 19, 2025
    The article is cited by 3 article(s) CLP online library. (Some content might be in Chinese.)
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (10)
    Equations (0)
    References (24)
    Cited By (3)
    Get Citation
    Copy Citation Text
    Yueping Kong, Xia Liu, Xinqian Xie, Fengjie Li. Face Liveness Detection Method Based on Histogram of Oriented Gradient[J]. Laser & Optoelectronics Progress, 2018, 55(3): 031009
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology