Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Laser & Optoelectronics Progress >Volume 56 >Issue 8 >Page 082301 > Article
    • Laser & Optoelectronics Progress
    • Vol. 56, Issue 8, 082301 (2019)
    Effects of Current and Temperature Stress on Reliability of LED Bulbs
    Xuyan Lan, Xin Yang, Shichen Su, and Yong Zhang*
    Author Affiliations
  • Institute of Optoelectronic Materials and Technology, South China Normal University, Guangzhou, Guangdong 510631, China
    • show less
    DOI: 10.3788/LOP56.082301 Cite this Article Set citation alerts
    Xuyan Lan, Xin Yang, Shichen Su, Yong Zhang. Effects of Current and Temperature Stress on Reliability of LED Bulbs[J]. Laser & Optoelectronics Progress, 2019, 56(8): 082301 Copy Citation Text show less
    Cited By
    Article index updated: Apr. 2, 2025
    The article is cited by 4 article(s) CLP online library. (Some content might be in Chinese.)
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (10)
    Equations (0)
    References (24)
    Cited By (4)
    Get Citation
    Copy Citation Text
    Xuyan Lan, Xin Yang, Shichen Su, Yong Zhang. Effects of Current and Temperature Stress on Reliability of LED Bulbs[J]. Laser & Optoelectronics Progress, 2019, 56(8): 082301
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology