Surface Defect Detectionon Polished Surface Based on Reflection Moir&#233;

Xianming Xiong; Hongqiang Shi; Xingyu Zeng

doi:10.3788/LOP56.141501

Journals >Laser & Optoelectronics Progress >Volume 56 >Issue 14 >Page 141501 > Article

Laser & Optoelectronics Progress
Vol. 56, Issue 14, 141501 (2019)

Surface Defect Detectionon Polished Surface Based on Reflection Moiré

Xianming Xiong^1,2,*, Hongqiang Shi¹, and Xingyu Zeng¹

Author Affiliations

¹ School of Electrical Engineering and Automation, Guilin University of Electronic Technology, Guilin, Guangxi 541004, China

² Key Laboratory of Optoelectronics Information Processing for Guangxi Universities, Guilin, Guangxi 541004, China

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DOI: 10.3788/LOP56.141501 Cite this Article Set citation alerts

Xianming Xiong, Hongqiang Shi, Xingyu Zeng. Surface Defect Detectionon Polished Surface Based on Reflection Moiré[J]. Laser & Optoelectronics Progress, 2019, 56(14): 141501 Copy Citation Text

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Xianming Xiong, Hongqiang Shi, Xingyu Zeng. Surface Defect Detectionon Polished Surface Based on Reflection Moiré[J]. Laser & Optoelectronics Progress, 2019, 56(14): 141501

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