MA Xiao-jun, GAO Dang-zhong, YANG Meng-sheng, ZHAO Xue-sen, YE Cheng-gang, TANG Yong-jian. Measurement of thickness of metal thin film by using chromatic confocal spectral technology[J]. Optics and Precision Engineering, 2011, 19(1): 17

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- Optics and Precision Engineering
- Vol. 19, Issue 1, 17 (2011)
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