• Journal of Applied Optics
  • Vol. 45, Issue 6, 1238 (2024)
Yiping WU1,*, Shangzhong JIN1, Yi DOU2, Siwei LI2..., Xuexin WANG2, Tieli HU2, Yulan HE2, Bing YU2, Yunlong ZHANG2 and Yue YOU2|Show fewer author(s)
Author Affiliations
  • 1College of Optical and Electronic Science Technology, China Jiliang University, Hangzhou 310018, China
  • 2Primary Optical Metrology Station of National Defense Science and Technology Industry, Xi'an Institute of Applied Optics, Xi'an 710065, China
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    DOI: 10.5768/JAO202445.0603004 Cite this Article
    Yiping WU, Shangzhong JIN, Yi DOU, Siwei LI, Xuexin WANG, Tieli HU, Yulan HE, Bing YU, Yunlong ZHANG, Yue YOU. Influence of vignetting on spectral transmittance measurement of infrared optical system[J]. Journal of Applied Optics, 2024, 45(6): 1238 Copy Citation Text show less

    Abstract

    In the infrared spectroscopic transmittance testing system based on the retro-reflective method, the position of the components such as aperture will affect the measurement of spectral transmittance of the infrared lens during measurement. To address this issue, a vignetting model was established to analyze the vignetting of the measurement beam in the testing system, and the vignetting formula generated by aperture and other components placing at different positions was derived. Experimental results show that maintaining the consistency in relative vignetting between the aerial and actual measurements can effectively reduce the effect of vignetting variations on the measurement of spectral transmittance of the infrared lens.
    Yiping WU, Shangzhong JIN, Yi DOU, Siwei LI, Xuexin WANG, Tieli HU, Yulan HE, Bing YU, Yunlong ZHANG, Yue YOU. Influence of vignetting on spectral transmittance measurement of infrared optical system[J]. Journal of Applied Optics, 2024, 45(6): 1238
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