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    Journals >Laser & Optoelectronics Progress >Volume 53 >Issue 11 >Page 111201 > Article
    • Laser & Optoelectronics Progress
    • Vol. 53, Issue 11, 111201 (2016)
    Measurement of 2.52 THz Back Scattering in Aluminium Plates with Four Kinds of Roughness
    Fan Changkun*, Li Qi, Zhou Yi, Zhao Yongpeng, and Chen Deying
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    DOI: 10.3788/lop53.111201 Cite this Article Set citation alerts
    Fan Changkun, Li Qi, Zhou Yi, Zhao Yongpeng, Chen Deying. Measurement of 2.52 THz Back Scattering in Aluminium Plates with Four Kinds of Roughness[J]. Laser & Optoelectronics Progress, 2016, 53(11): 111201 Copy Citation Text show less
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    Article index updated: Mar. 25, 2025
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    Fan Changkun, Li Qi, Zhou Yi, Zhao Yongpeng, Chen Deying. Measurement of 2.52 THz Back Scattering in Aluminium Plates with Four Kinds of Roughness[J]. Laser & Optoelectronics Progress, 2016, 53(11): 111201
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