Research on Test Method and Test System of WDM Device for 5G Fronthaul Network

Chun-lin HU; Zi-ting GUAN; Chun YANG

doi:10.13756/j.gtxyj.2022.04.015

Journals >Study On Optical Communications >Volume 48 >Issue 4 >Page 73 > Article

Study On Optical Communications
Vol. 48, Issue 4, 73 (2022)

Research on Test Method and Test System of WDM Device for 5G Fronthaul Network

Chun-lin HU^*, Zi-ting GUAN, and Chun YANG

Author Affiliations

WRI Testing Technologies Co., Ltd., Wuhan 430205, China

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DOI: 10.13756/j.gtxyj.2022.04.015 Cite this Article

Chun-lin HU, Zi-ting GUAN, Chun YANG. Research on Test Method and Test System of WDM Device for 5G Fronthaul Network[J]. Study On Optical Communications, 2022, 48(4): 73 Copy Citation Text

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通道	标称中心波长/nm	比对偏差=│手动测试数值-自动测试数值│
通道	标称中心波长/nm	中心波长/nm	中心波长偏差/nm	插入损耗最大值/dB	AX/dB	NX/dB
1	1271	0.012	0.012	0.02	0.04	0.02
2	1291	0.008	0.008	0.03	0.01	0.00
3	1311	0.004	0.004	0.02	0.01	0.08
4	1331	0.013	0.013	0.04	0.02	0.11
5	1351	0.001	0.001	0.06	0.03	0.06
6	1371	0.023	0.023	0.05	0.07	0.15
偏差平均值		0.010	0.010	0.04	0.03	0.07
偏差最大值		0.023	0.023	0.06	0.07	0.15
偏差最小值		0.001	0.001	0.02	0.01	0.00

Table 1. [in Chinese]

Chun-lin HU, Zi-ting GUAN, Chun YANG. Research on Test Method and Test System of WDM Device for 5G Fronthaul Network[J]. Study On Optical Communications, 2022, 48(4): 73

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