• Chinese Optics Letters
  • Vol. 8, Issue s1, 25 (2010)
Yiqin Ji1,2, Deying Chen1, Huasong Liu2,3, Zhanshan Wang3..., Wei Hong2 and Dandan Liu2|Show fewer author(s)
Author Affiliations
  • 1National Key Laboratory of Tunable Laser Technology, Institute of Opto-electronics, Harbin Institute of Technology, Harbin 150001, China
  • 2Tianjin Key Laboratory of Optical Thin Films, Tianjin Institute of Jinhang Technical Physics, Tianjin 300192, China
  • 3Institute of Precision Optical Engineering, Department of Physics, Tongji University, Hanghai 200092, China
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    DOI: 10.3788/COL201008s1.0025 Cite this Article Set citation alerts
    Yiqin Ji, Deying Chen, Huasong Liu, Zhanshan Wang, Wei Hong, Dandan Liu, "Exact and numerical design of non-polarizing edge filters," Chin. Opt. Lett. 8, 25 (2010) Copy Citation Text show less

    Abstract

    Multilayer dielectric thin films have polarization effects at non-normal incidence. In this letter, specifications include s- and p-polarization transmittance (Ts,(p) ≥ 95% at 790—808 nm), s- and p-polarization reflectance (Rs,(p) ≥ 95% at 814—860 nm), angle of incidence (AOI) = 45°, air as incident medium, and BK7 glass as substrate. Based on the two chosen materials (Ta2O5 and SiO2), non-polarized edge filters are carried out using the design methods of the detuned multiple half-wave filters (exact design) and the needle optimization (numerical design). Exact design has a total of 112 layers and 12 cavities; optical thickness is 126 quartwaves at 860 nm. Numerical design has a total of 107 layers and 8 cavities; optical thickness is 91 quartwaves at 850 nm. Hence, the numerical design has less layers and thickness, thus meeting the same specifications of the exact design.