• Electro-Optic Technology Application
  • Vol. 39, Issue 1, 60 (2024)
JIN Hui1, SHENG Liwen1、2、3, JU Junwei1, HUANG Lin1、2、4, ZHANG Aiguo1, LIU Zhiming1, and QIAO Shan1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    DOI: Cite this Article
    JIN Hui, SHENG Liwen, JU Junwei, HUANG Lin, ZHANG Aiguo, LIU Zhiming, QIAO Shan. Design of Ultra-wide Bandwidth Electro-optic Modulation Chip Parameter Testing System (Invited)[J]. Electro-Optic Technology Application, 2024, 39(1): 60 Copy Citation Text show less

    Abstract

    Frequency domain parameters such as bandwidth and response flatness of electro-optical modulator chip are important evaluation indexes to measure the performance of electro-optical modulator chip. The frequency domain parameter testing method of electro-optical modulator chip is studied, and a frequency response parameter testing system of electro-optical modulator chip based on ultra-wide bandwidth lightwave component analyzer is established. The core frequency response parameters of the electro-optical modulator chip are tested in the range of 10 MHz~110 GHz. Experimental results show that the measurement results of the proposed method are in good agreement with the simulation results, and it is an efficient and high-precision method for testing the frequency response parameters of the electro-optical modulator chip.
    JIN Hui, SHENG Liwen, JU Junwei, HUANG Lin, ZHANG Aiguo, LIU Zhiming, QIAO Shan. Design of Ultra-wide Bandwidth Electro-optic Modulation Chip Parameter Testing System (Invited)[J]. Electro-Optic Technology Application, 2024, 39(1): 60
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