• Electro-Optic Technology Application
  • Vol. 32, Issue 2, 21 (2017)
LI Qing-xuan1, YANG Xu1, and QIN Wen-bin2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    LI Qing-xuan, YANG Xu, QIN Wen-bin. Research on Anti-reflective Laser Damage Technology of High Power Diode Laser[J]. Electro-Optic Technology Application, 2017, 32(2): 21 Copy Citation Text show less

    Abstract

    The reflected laser damage has affected the further application of high power diode lasers in industry processing. It is very important to the research on the problem of reflected laser damage technology for solving the problem of the high power diode lasers in industrial application. The active anti-reflective laser damage of the high power diode lasers is realized based on the line polarized laser characteristic of diode laser and using the combination device of polarized beam splitter and λ/4 wave plate. The reflective laser intensity is monitored by the electro-optic monitoring unit. When the reflective laser intensity is higher than the damage threshold, the laser output is closed to realize the passive anti-reflective laser damage. The anti-reflective laser damage device with both active and passive anti-reflective laser damage functions is researched which can be used in the high power diode laser of industrial processing.
    LI Qing-xuan, YANG Xu, QIN Wen-bin. Research on Anti-reflective Laser Damage Technology of High Power Diode Laser[J]. Electro-Optic Technology Application, 2017, 32(2): 21
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