• Laser & Optoelectronics Progress
  • Vol. 60, Issue 17, 1714009 (2023)
Xu He1, Yuncan Ma1,*, Jun Li1, Mingzhou Yuan2..., Meifang Yin2, Limin Meng1, Yan Ye1, Hang Zhang1 and Jun Wu2|Show fewer author(s)
Author Affiliations
  • 1Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang 621900, Sichuan , China
  • 2Department of Burn and Plastic Surgery, Institute for Translation Medicine, Shenzhen Second People's Hospital, Shenzhen 518035, Guangdong , China
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    DOI: 10.3788/LOP222408 Cite this Article Set citation alerts
    Xu He, Yuncan Ma, Jun Li, Mingzhou Yuan, Meifang Yin, Limin Meng, Yan Ye, Hang Zhang, Jun Wu. Method and Application of Femtosecond Laser Processing on Non-Flat Surfaces[J]. Laser & Optoelectronics Progress, 2023, 60(17): 1714009 Copy Citation Text show less
    Experimental setup for femtosecond laser processing
    Fig. 1. Experimental setup for femtosecond laser processing
    Software interface of femtosecond laser processing system
    Fig. 2. Software interface of femtosecond laser processing system
    Results of the focus evaluation functions (fun 1‍‒‍fun 4 correspond to gray-level fluctuation function, gradient square function, Laplace gradient function, and quadratic gradient squared function)
    Fig. 3. Results of the focus evaluation functions (fun 1‍‒‍fun 4 correspond to gray-level fluctuation function, gradient square function, Laplace gradient function, and quadratic gradient squared function)
    Schematic of correction by sub-regional plane fitting. (a) Original machining path; (b) sample surface; (c) corrected machining path; (d) flow chart of proposed method
    Fig. 4. Schematic of correction by sub-regional plane fitting. (a) Original machining path; (b) sample surface; (c) corrected machining path; (d) flow chart of proposed method
    Schematic of sub-region division and sample points selection. (a) Divide into one rectangle region; (b) schematic of error calculation; (c) divide into rectangle regions by 2×2
    Fig. 5. Schematic of sub-region division and sample points selection. (a) Divide into one rectangle region; (b) schematic of error calculation; (c) divide into rectangle regions by 2×2
    Schematic of correction by two-dimensional interpolation. (a) Original machining path; (b) sample surface; (c) corrected machining path; (d) flow chart of proposed method
    Fig. 6. Schematic of correction by two-dimensional interpolation. (a) Original machining path; (b) sample surface; (c) corrected machining path; (d) flow chart of proposed method
    Schematic of femtosecond laser processing. (a) Single direction machining in Y direction; (b) double direction machining in XY directions
    Fig. 7. Schematic of femtosecond laser processing. (a) Single direction machining in Y direction; (b) double direction machining in XY directions
    Surface sampling point of sample 2 and results of plane fitting in each sub-region
    Fig. 8. Surface sampling point of sample 2 and results of plane fitting in each sub-region
    Surface microstructure machining results. (a) Photograph of experimental sample after machining; (b) schematic of characterization locations by SEM; (c) SEM image of sample 1; (d) SEM image of sample 2
    Fig. 9. Surface microstructure machining results. (a) Photograph of experimental sample after machining; (b) schematic of characterization locations by SEM; (c) SEM image of sample 1; (d) SEM image of sample 2
    Groove width machining at different Z distances (Δz=0 represents machining at the focal point)
    Fig. 10. Groove width machining at different Z distances (Δz=0 represents machining at the focal point)
    Surface sampling point of sample 4 and intermediate points calculated by interpolation
    Fig. 11. Surface sampling point of sample 4 and intermediate points calculated by interpolation
    Result of micro-bulges machining. (a) Photograph of experimental sample after machining; (b) schematic of characterization locations by SEM; (c) SEM image of sample 3; (d) SEM image of sample 4
    Fig. 12. Result of micro-bulges machining. (a) Photograph of experimental sample after machining; (b) schematic of characterization locations by SEM; (c) SEM image of sample 3; (d) SEM image of sample 4
    ItemFitting parameterFitting error /μm
    DxDyL0z0z1z3zcorner
    10.0026820.005182-85.228522.1-50.46.1-66.4
    20.0089090.003364-107.18902.9-9.13.4-8.6
    3-0.0041800.00336470.85122.6-7.42.1-7.9
    40.0083640.005182-130.76303.1-9.93.6-9.4
    5-0.0030900.0063648.84963.2-3.8-2.8-9.8
    Table 1. Plane fitting data of experiment sample 2
    Y-axis value of intermediate pointz
    X-axis value of intermediate point
    435798571535720857
    30541.40.8-2.7-0.8
    8554-0.8-0.20.70.2
    14054-1.40.11.61.2
    195540.4-0.7-1.31.1
    Table 2. Difference Δz between real Z-axis value and interpolation Z-axis value of intermediate point of experiment sample 4
    Xu He, Yuncan Ma, Jun Li, Mingzhou Yuan, Meifang Yin, Limin Meng, Yan Ye, Hang Zhang, Jun Wu. Method and Application of Femtosecond Laser Processing on Non-Flat Surfaces[J]. Laser & Optoelectronics Progress, 2023, 60(17): 1714009
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