X-ray photoelectron spectroscopy of Ge1-xCx thin films prepared by RLVIP technique

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Journals >Optics and Precision Engineering >Volume 16 >Issue 4 >Page 565 > Article

Optics and Precision Engineering
Vol. 16, Issue 4, 565 (2008)

X-ray photoelectron spectroscopy of Ge1-xCx thin films prepared by RLVIP technique

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. X-ray photoelectron spectroscopy of Ge1-xCx thin films prepared by RLVIP technique[J]. Optics and Precision Engineering, 2008, 16(4): 565 Copy Citation Text

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Abstract

作者简介：通讯作者:高劲松(1968-),男,吉林白城人,研究员,主要研究方向为光学薄膜的前沿研究以及特种光学薄膜.E-mail:gaojs@ciomp.ac.cn