[1] ZHANG L D. Numerical simulation and analyses on environment tests for the electronic equipment[D]. Beijing: North China Electric Power University, 2005. (in Chinese)
[2] XIE J S. Study on the thermal analysis and thermal design of MCM [D].Chendu: University of Electronic Science and Technology of China, 2005. (in Chinese)
[3] WANG Y T. Study on the thermal analysis of electronic components[D]. Xian: Northwesten Polytechnocal University, 2004. (in Chinese)
[4] GAO X X. Investigation on thermal design of high power electronic components and equipment structure[D]. Beijing: North China Electric Power University, 2006. (in Chinese)
[5] YU C Y, YU X ZH, YANG W M. A preliminary study on the techniques for thermal Analysis/Design/Test of Electronic Equipments[J]. Microelectronics. 2000,30(5):334-337. (in Chinese)
[6] LV Y CH, YANG SH G. A review of thermal analysis, thermal design and thermal test technology and their recent development [J]. Electro-Mechanical Engineering, 2007,23(1):5-10. (in Chinese)
[7] MIN G R, GUO SH. Spacecraft Thermal Control[M]. 2nd ed. Beijing: Science Press,1998. (in Chinese)
[8] HARVEST J, FLESCHER S A, WEINTSTEIN R D. Modeling of the thermal effects of heat generating devices in close proximity on vertically oriented printed circuit boards for thermal management applications [J]. International Journal of Thermal Sciences 2007, 46:253-261.
[9] FLEISCHER A S, WEINSTEIN R D, KHOBRAGADE S A. Forced convective cooling of electro -optical components maintained at different temperatures on a vertically oriented printed circuit board [J]. IEEE Transactions on Components and Packaging Technology 2004,27(2):296-304.
[10] WEISS J, LANGHORST F. Thermal analysis of electronic packaging[J]. Australian Electronics Engineering, 1988,21(8):62-64.
[11] DUMERCY L, GLISES R, LOUAHLIA-GUALOUS H, et al.. Thermal management of a PEMFC stack by 3D nodal modeling [J]. Journal of Power Sources, 2006,156:78-84.
[14] VELLVEHI M, JORDA X, GODIGNON P, et al.. Coupled electro-thermal simulation of a DC/DC converter [J]. Microelectronics Reliability,2007,47:2114-2121.