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    Journals >Electro-Optic Technology Application >Volume 33 >Issue 3 >Page 65 > Article
    • Electro-Optic Technology Application
    • Vol. 33, Issue 3, 65 (2018)
    Application of Wavelet Transform in Rigidity Characteristic Measurement of Quartz Reed
    BI Xue-mei1 and HAO Ben-gong2
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    BI Xue-mei, HAO Ben-gong. Application of Wavelet Transform in Rigidity Characteristic Measurement of Quartz Reed[J]. Electro-Optic Technology Application, 2018, 33(3): 65 Copy Citation Text show less
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    BI Xue-mei, HAO Ben-gong. Application of Wavelet Transform in Rigidity Characteristic Measurement of Quartz Reed[J]. Electro-Optic Technology Application, 2018, 33(3): 65
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