• Optics and Precision Engineering
  • Vol. 26, Issue 1, 1 (2018)
LIANG Ju-xi1,*, ZHENG Yan-chang2, QIU Ke-qiang1, LIU Zheng-kun1..., XU Xiang-dong1 and HONG Yi-lin1|Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/ope.20182601.0001 Cite this Article
    LIANG Ju-xi, ZHENG Yan-chang, QIU Ke-qiang, LIU Zheng-kun, XU Xiang-dong, HONG Yi-lin. Calibration method of silicon 〈111〉 orientation and its application in fabrication of silicon grating by anisotropic wet etching[J]. Optics and Precision Engineering, 2018, 26(1): 1 Copy Citation Text show less

    Abstract

    Gratings with many types of groove profiles such as rectangles and triangles can be fabricated by wet etching silicon, during which a key step is to accurately align the grating line of the mask with the 〈111〉 orientation of silicon. Sidewall roughness can be visibly reduced by high-precision alignment, which is necessary for the fabrication of large grating structures. A fanned alignment pattern was designed and fabricated, which was then etched to accurately determine the 〈111〉 orientation of silicon. After determining the 〈111〉 orientation, a grating with a height of 48.3 μm, period of 5 μm, and area of 15 mm×15 mm was fabricated successfully by ultraviolet lithography and wet etching. The aspect ratio of the grating was approximately 20, and the roughness of the lines sidewalls was 0.404 nm. A rectangular grating with a large aspect ratio and a triangular-grooved grating were fabricated successfully with holographic lithography and wet etching. The rectangular grating was 4.8 μm tall with a period of 333 nm and an area of 50 mm×60 mm. Its aspect ratio was approximately 100 with a sidewall roughness of 0.267 nm. The period of the V-groove grating was 2.5 μm, and its sidewall roughness was 0.406 nm.
    LIANG Ju-xi, ZHENG Yan-chang, QIU Ke-qiang, LIU Zheng-kun, XU Xiang-dong, HONG Yi-lin. Calibration method of silicon 〈111〉 orientation and its application in fabrication of silicon grating by anisotropic wet etching[J]. Optics and Precision Engineering, 2018, 26(1): 1
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