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    Journals >Laser & Optoelectronics Progress >Volume 52 >Issue 5 >Page 53101 > Article
    • Laser & Optoelectronics Progress
    • Vol. 52, Issue 5, 53101 (2015)
    Investigation of the Intrinsic Damage Mechanisms for Optical Thin Film in Vacuum Environments
    Ling Xiulan1,*, Wang Gao1, and Liu Xiaofeng2
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop52.053101 Cite this Article Set citation alerts
    Ling Xiulan, Wang Gao, Liu Xiaofeng. Investigation of the Intrinsic Damage Mechanisms for Optical Thin Film in Vacuum Environments[J]. Laser & Optoelectronics Progress, 2015, 52(5): 53101 Copy Citation Text show less
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    Article index updated: Mar. 25, 2025
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    Ling Xiulan, Wang Gao, Liu Xiaofeng. Investigation of the Intrinsic Damage Mechanisms for Optical Thin Film in Vacuum Environments[J]. Laser & Optoelectronics Progress, 2015, 52(5): 53101
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