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    Journals >Modern Scientific Instruments >Volume 18 >Issue 2 >Page 69 > Article
    • Modern Scientific Instruments
    • Vol. 18, Issue 2, 69 (2008)
    The Application of ICP-MS in Investigating Content of Metal Ion Elements in Transgenic Yeast
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. The Application of ICP-MS in Investigating Content of Metal Ion Elements in Transgenic Yeast[J]. Modern Scientific Instruments, 2008, 18(2): 69 Copy Citation Text show less

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    作者简介：印莉萍(E-mail:yinlp@mail.cnu.edu.cn).通讯联系人

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. The Application of ICP-MS in Investigating Content of Metal Ion Elements in Transgenic Yeast[J]. Modern Scientific Instruments, 2008, 18(2): 69
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