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    Journals >Optics and Precision Engineering >Volume 16 >Issue 1 >Page 55 > Article
    • Optics and Precision Engineering
    • Vol. 16, Issue 1, 55 (2008)
    Measurement of defect depth by infrared thermal wave nondestructive evaluation based on pulsed phase
    1, 1, 2, and 2
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  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of defect depth by infrared thermal wave nondestructive evaluation based on pulsed phase[J]. Optics and Precision Engineering, 2008, 16(1): 55 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of defect depth by infrared thermal wave nondestructive evaluation based on pulsed phase[J]. Optics and Precision Engineering, 2008, 16(1): 55
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