In infrared imaging system, crosstalk reduces definition of the image, affects the resolution performance and the imaging quality of focal plane array. Therefore, it is necessary to study the test and generation mechanism of crosstalk. Three types of testing methods and principle of crosstalk effect are compared, generation mechanisms are elaborated from two aspects of optical crosstalk and electrical crosstalk, and solutions of crosstalk are systematically summarized. At the same time, the future development trend of the infrared imaging device are also discussed. In order to offer beneficial reference for improving the relative device technology, structure and manufacturing process.