• Optoelectronics Letters
  • Vol. 20, Issue 5, 257 (2024)
Xiang LING1, Pengfei ZHU1,2,*, Kun ZHU2, Pei SONG1, and Xiong LI3
Author Affiliations
  • 1School of Mathematics, Physics and Statistics, Shanghai University of Engineering Science, Shanghai 201600, China
  • 2School of Electrical Engineering, Liupanshui Normal University, Liupanshui 553004, China
  • 3School of Railway Telecommunication, Hunan Technical College of Railway High-speed, Hengyang 421002, China
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    DOI: 10.1007/s11801-024-3101-x Cite this Article
    LING Xiang, ZHU Pengfei, ZHU Kun, SONG Pei, LI Xiong. Lateral photovoltaic effect in the Ni-SiO2-Si structure with bias[J]. Optoelectronics Letters, 2024, 20(5): 257 Copy Citation Text show less

    Abstract

    We designed a clamping device to study lateral photovoltaic effect (LPE) in Ni-SiO2-Si structure with bias due to the appropriate barrier height. The LPE has a prominent sensitivity and linearity with 532 nm wavelength laser. The tran-sient response time is 450 μs and the relaxation time is 2 250 μs in the Ni-SiO2-Si structure without bias. The LPE sen-sitivity has a significant improvement with bias. The transient response time is 6 μs and the relaxion time is 47 μs with ?7 V bias, not only improving the LPE sensitivity, but also increasing the response speed with bias. The research shows that the Schottky barrier structure can improve the sensitivity and linearity of LPE with bias effectively, and thus it can be used in position sensitive sensors.
    LING Xiang, ZHU Pengfei, ZHU Kun, SONG Pei, LI Xiong. Lateral photovoltaic effect in the Ni-SiO2-Si structure with bias[J]. Optoelectronics Letters, 2024, 20(5): 257
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