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    Journals >Laser & Optoelectronics Progress >Volume 59 >Issue 22 >Page 2210009 > Article
    • Laser & Optoelectronics Progress
    • Vol. 59, Issue 22, 2210009 (2022)
    Phase Fringe Pattern Filtering Method for Shearography Using Deep Learning
    Wei Lin1, Haihua Cui1,*, Wei Zheng2, Xinfang Zhou2..., Zhenlong Xu1 and Wei Tian1|Show fewer author(s)
    Author Affiliations
  • 1College of Mechanical & Electrical Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing 211106, Jiangsu, China
  • 2AVIC Xi'an Aircraft Industry Group Co., Ltd., Xi'an 710089, Shaanxi, China
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    DOI: 10.3788/LOP202259.2210009 Cite this Article Set citation alerts
    Wei Lin, Haihua Cui, Wei Zheng, Xinfang Zhou, Zhenlong Xu, Wei Tian. Phase Fringe Pattern Filtering Method for Shearography Using Deep Learning[J]. Laser & Optoelectronics Progress, 2022, 59(22): 2210009 Copy Citation Text show less
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    Article index updated: Mar. 25, 2025
    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
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    Wei Lin, Haihua Cui, Wei Zheng, Xinfang Zhou, Zhenlong Xu, Wei Tian. Phase Fringe Pattern Filtering Method for Shearography Using Deep Learning[J]. Laser & Optoelectronics Progress, 2022, 59(22): 2210009
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    Paper Information
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