As a sensor to convert image from optical to electrical signal, charge coupled device (CCD) has been paid much attention to its image quality which is directly related to the radiation response characteristic parameters. Since array CCD is gaining more and more popularity, a concept of“radiation response matrix” and an evaluation method are put forward, and used to describe radiation response of each pixel of CCD. By analyzing of this matrix, and clearly defining physical concept of each element, parameters such as absolute radiation response, non-linearity, dark noise, signal-to-noise of each pixel and non-uniformity of CCD are in one-to-one correspondence with mathematical relation of the matrix. Response characteristic coefficient of each pixel is obtained using the model of radiation response matrix analysis by a test on area CCD DALSAFTF6080M. One application of this matrix is demonstrated. Experimental results show that non-uniformity of this CCD is 3.1% , its response is linear, and its dark noise is 3.84. This method is feasible and practical, and it satisfies the requirement of the objective evaluation of array CCD.