Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Laser & Optoelectronics Progress >Volume 53 >Issue 7 >Page 72201 > Article
    • Laser & Optoelectronics Progress
    • Vol. 53, Issue 7, 72201 (2016)
    Fabrication of GaN Nano-Pillar Arrays with Tunable Duty Ratio and Study on Its Photoluminescence Efficiency
    Chen Zhanxu1,*, Wan Wei1, Chen Gengyan2, He Yingji1, and Chen Yongzhu2
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
    • show less
    DOI: 10.3788/lop53.072201 Cite this Article Set citation alerts
    Chen Zhanxu, Wan Wei, Chen Gengyan, He Yingji, Chen Yongzhu. Fabrication of GaN Nano-Pillar Arrays with Tunable Duty Ratio and Study on Its Photoluminescence Efficiency[J]. Laser & Optoelectronics Progress, 2016, 53(7): 72201 Copy Citation Text show less
    Cited By
    Article index updated: Mar. 25, 2025
    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (24)
    Cited By (1)
    Get Citation
    Copy Citation Text
    Chen Zhanxu, Wan Wei, Chen Gengyan, He Yingji, Chen Yongzhu. Fabrication of GaN Nano-Pillar Arrays with Tunable Duty Ratio and Study on Its Photoluminescence Efficiency[J]. Laser & Optoelectronics Progress, 2016, 53(7): 72201
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology