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    Journals >Acta Photonica Sinica >Volume 31 >Issue 4 >Page 454 > Article
    • Acta Photonica Sinica
    • Vol. 31, Issue 4, 454 (2002)
    X-RAY DIFFRACTION ANALYSIS ON THE Al CONTENT OF THE AlGaAs BUFFER LAYER IN THE TRANSPARENT GaAs PHOTOCATHODE
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. X-RAY DIFFRACTION ANALYSIS ON THE Al CONTENT OF THE AlGaAs BUFFER LAYER IN THE TRANSPARENT GaAs PHOTOCATHODE[J]. Acta Photonica Sinica, 2002, 31(4): 454 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. X-RAY DIFFRACTION ANALYSIS ON THE Al CONTENT OF THE AlGaAs BUFFER LAYER IN THE TRANSPARENT GaAs PHOTOCATHODE[J]. Acta Photonica Sinica, 2002, 31(4): 454
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