• Journal of Synthetic Crystals
  • Vol. 51, Issue 2, 333 (2022)
ZHANG Xuqing1,2,*, LUO Hao1, LI Jiajun2, WANG Rong2..., YANG Deren1,2 and PI Xiaodong1,2|Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    ZHANG Xuqing, LUO Hao, LI Jiajun, WANG Rong, YANG Deren, PI Xiaodong. Research Progress on Wet Etching of Semiconductor SiC[J]. Journal of Synthetic Crystals, 2022, 51(2): 333 Copy Citation Text show less

    Abstract

    Silicon carbide (SiC) possesses excellent properties of wide band gap, high electron saturation velocity, high breakdown field strength, high thermal conductivity and good chemical stability, etc. SiC is an ideal raw material for high-performance power device and other semiconductor devices. With the advantages of simple processing, convenient operation and low-cost equipment requirements, wet etching has been adopted in the materials characterization and device of SiC. Defect analysis and surface modification can all greatly benefit from wet etching. According to the underlying mechanisms, wet etching can be classified into electrochemical etching and chemical etching. In this review, the mechanisms, equipments and applications of both electrochemical etching and chemical etching have been introduced.
    ZHANG Xuqing, LUO Hao, LI Jiajun, WANG Rong, YANG Deren, PI Xiaodong. Research Progress on Wet Etching of Semiconductor SiC[J]. Journal of Synthetic Crystals, 2022, 51(2): 333
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