Junyan Zhuang, Yunyun Chen, Yayi Chen. Double-Temperature Measurements of Arc Plasmas by Integrating Two-Wavelength Moiré and Emission Tomography[J]. Laser & Optoelectronics Progress, 2023, 60(17): 1712006
- Laser & Optoelectronics Progress
- Vol. 60, Issue 17, 1712006 (2023)
Fig. 1. Schematic diagram of two-wavelength Moiré and emission tomography
Fig. 2. Measured arc plasma and deflected Moiré fringes (0.3 MPa). (a) Arc plasma; (b) 532 nm; (c) 808 nm
Fig. 3. Measured arc plasma and deflected Moiré fringes (0.5 MPa). (a) Arc plasma; (b) 532 nm; (c) 808 nm
Fig. 4. Referenced Moiré fringes. (a) 532 nm; (b) 808 nm
Fig. 5. 3-D distributions of refractive index (0.3 MPa). (a) 532 nm; (b) 808 nm
Fig. 6. 3-D distributions of refractive index (0.5 MPa). (a) 532 nm; (b) 808 nm
Fig. 7. Radial refractive index distributions. (a) 0.3 MPa; (b) 0.5 MPa
Fig. 8. Radial intensity distributions. (a) 0.3 MPa; (b) 0.5 MPa
Fig. 9. Ionization degree distributions. (a) 0.3 MPa; (b) 0.5 MPa
Fig. 10. Temperature distributions. (a) 0.3 MPa; (b) 0.5 MPa
Set citation alerts for the article
Please enter your email address
© Copyright 2018-2021 | Chinese Laser Press. All Rights Reserved 沪ICP备15018463号-20