• Optics and Precision Engineering
  • Vol. 24, Issue 1, 59 (2016)
YUAN Lin-guang*, XUE Zhan-li, LI Hong-guang, LI Tao, and YANG Hong-ru
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/ope.20162401.0059 Cite this Article
    YUAN Lin-guang, XUE Zhan-li, LI Hong-guang, LI Tao, YANG Hong-ru. Measurement of normal emissivity of materials at low temperature[J]. Optics and Precision Engineering, 2016, 24(1): 59 Copy Citation Text show less

    Abstract

    The measuring methods for normal emissivities of materials at -60—50 ℃ was explored. To achieve accurate measurement of normal emissivity of materials at temperature range of -60 ℃ to 50 ℃, a measurement model of normal emissivity of materials was established based on the emissivity definition. To shield the effects of environment stray radiation and atmospheric absorption, a measurement facility of the materials at low temperature was built by utilizing a vacuum and liquid nitrogen background channel. The normal emissivities of two samples (copper oxide and high emissivity ceramic) were measured by this facility. The results show that normal spectral emissivities of two samples decrease with wavelengths. Moreover, with temperature increasing, the normal integral emissivity of the copper oxide keeps stable at the range of 0.850±0.012 and that of the high emissivity ceramic reduces by 0.124. Finally, the infrared spectral irradiation was acquired in higher precision at a lower temperature condition, the measurement uncertainty of normal spectral emissivities of materials at low temperature was analyzed. The results show that the relative expanded uncertainty is less than 6.0%.
    YUAN Lin-guang, XUE Zhan-li, LI Hong-guang, LI Tao, YANG Hong-ru. Measurement of normal emissivity of materials at low temperature[J]. Optics and Precision Engineering, 2016, 24(1): 59
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