• Acta Physica Sinica
  • Vol. 69, Issue 13, 137801-1 (2020)
Xian-Cheng Meng, He Tian, Xia An, Shuo Yuan..., Chao Fan*, Meng-Jun Wang and Hong-Xing Zheng|Show fewer author(s)
Author Affiliations
  • School of Electronic and Information Engineering, Hebei University of technology, Tianjin 300401, China
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    DOI: 10.7498/aps.69.20191960 Cite this Article
    Xian-Cheng Meng, He Tian, Xia An, Shuo Yuan, Chao Fan, Meng-Jun Wang, Hong-Xing Zheng. Field effect transistor photodetector based on two dimensional SnSe2[J]. Acta Physica Sinica, 2020, 69(13): 137801-1 Copy Citation Text show less
    (a) Diagram of CVT; (b) SnSe2 single crystal; (c) Diagram of graph transfer method.
    Fig. 1. (a) Diagram of CVT; (b) SnSe2 single crystal; (c) Diagram of graph transfer method.
    (a) XRD spectrum and (b) TEM image of SnSe2.
    Fig. 2. (a) XRD spectrum and (b) TEM image of SnSe2.
    XPS spectrum of SnSe2.
    Fig. 3. XPS spectrum of SnSe2.
    (a) AFM of sample; (b) Optical micro-image of sample.
    Fig. 4. (a) AFM of sample; (b) Optical micro-image of sample.
    Raman spectrum of sample.
    Fig. 5. Raman spectrum of sample.
    (a) Output characteristic of the field effect transistor based on two-dimensional SnSe2; (b) Transfer characteristic of the field effect transistor.
    Fig. 6. (a) Output characteristic of the field effect transistor based on two-dimensional SnSe2; (b) Transfer characteristic of the field effect transistor.
    I-V curve: (a) 405 nm; (b) 532 nm; (c) 650 nm. Photocurrent curve: (d) 405 nm; (e) 532 nm; (f) 650 nm. Rising edge and falling edge: (g) 405 nm; (h) 532 nm; (i) 650 nm.
    Fig. 7. I-V curve: (a) 405 nm; (b) 532 nm; (c) 650 nm. Photocurrent curve: (d) 405 nm; (e) 532 nm; (f) 650 nm. Rising edge and falling edge: (g) 405 nm; (h) 532 nm; (i) 650 nm.
    Light response curve: (a) 405 nm; (b) 532 nm; (c) 650 nm. Responsivity and detectivity scatter plot of device: (d) 405 nm; (e) 532 nm; (f)650 nm.
    Fig. 8. Light response curve: (a) 405 nm; (b) 532 nm; (c) 650 nm. Responsivity and detectivity scatter plot of device: (d) 405 nm; (e) 532 nm; (f)650 nm.
    Xian-Cheng Meng, He Tian, Xia An, Shuo Yuan, Chao Fan, Meng-Jun Wang, Hong-Xing Zheng. Field effect transistor photodetector based on two dimensional SnSe2[J]. Acta Physica Sinica, 2020, 69(13): 137801-1
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