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    Journals >Laser & Optoelectronics Progress >Volume 52 >Issue 2 >Page 21801 > Article
    • Laser & Optoelectronics Progress
    • Vol. 52, Issue 2, 21801 (2015)
    Effect of Aberration Induced by Refractive Index Mismatch on Imaging in Confocal Microscopy
    Xiao Yun1,2,3,*, Zhang Yunhai1, and Tan Huiming1
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/lop52.021801 Cite this Article Set citation alerts
    Xiao Yun, Zhang Yunhai, Tan Huiming. Effect of Aberration Induced by Refractive Index Mismatch on Imaging in Confocal Microscopy[J]. Laser & Optoelectronics Progress, 2015, 52(2): 21801 Copy Citation Text show less
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    Article index updated: Mar. 24, 2025
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    Xiao Yun, Zhang Yunhai, Tan Huiming. Effect of Aberration Induced by Refractive Index Mismatch on Imaging in Confocal Microscopy[J]. Laser & Optoelectronics Progress, 2015, 52(2): 21801
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