Yan Lu, Xuefen Kan, Tian Xu, Jinghuai Fang, Meng Wang, Cheng Yin, Xianfeng Chen, "Simple Raman scattering sensor integrated with a metallic planar optical waveguide: effective modulation via minor structural adjustment," Chin. Opt. Lett. 16, 012301 (2018)
- Chinese Optics Letters
- Vol. 16, Issue 1, 012301 (2018)
Fig. 1. Schematic diagram of the MCOW structure.
Fig. 2. (Color online) ATR spectra of TE and TM polarization of an MCOW chip. The wavelength is 785 nm, and the dielectric constant of silver, PMMA, and glass is taken as ε Ag = − 26 + 1.5 i ε PMMA = 2.21 ε glass = 2.28
Fig. 3. Electric field distribution of a single mode in different thicknesses of PMMA films. (a) 0.5, (b) 0.8, (c) 1.0, (d) 1.3, and (e) 1.5 μm.
Fig. 4. (a) Experimental setup for reflectivity detection; (b) the reflection spectra of the MCOW chip with 7 μm PMMA film.
Fig. 5. Raman spectra of CuPc obtained via MCOW with five different PMMA film thicknesses: 7, 11, 16, 19, and 23 μm, respectively.
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Table 1. Characteristic Peak Intensity of CuPc in Different Thickness PMMA Films
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