Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Laser & Optoelectronics Progress >Volume 51 >Issue 8 >Page 80701 > Article
    • Laser & Optoelectronics Progress
    • Vol. 51, Issue 8, 80701 (2014)
    Vortex Phase Retrieval for Detecting System Aberration Based on Liquid Crystal Spatial Light Modulator
    Wu Huaqin1,2,3,*, Zheng Mingjie1,2,3, Li Zhifang1,2,3, Chen Daqiang1,2,3, and Li Hui1,2,3
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
    • show less
    DOI: 10.3788/lop51.080701 Cite this Article Set citation alerts
    Wu Huaqin, Zheng Mingjie, Li Zhifang, Chen Daqiang, Li Hui. Vortex Phase Retrieval for Detecting System Aberration Based on Liquid Crystal Spatial Light Modulator[J]. Laser & Optoelectronics Progress, 2014, 51(8): 80701 Copy Citation Text show less
    Cited By
    Article index updated: Mar. 29, 2025
    The article is cited by 4 article(s) CLP online library. (Some content might be in Chinese.)
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (19)
    Cited By (4)
    Get Citation
    Copy Citation Text
    Wu Huaqin, Zheng Mingjie, Li Zhifang, Chen Daqiang, Li Hui. Vortex Phase Retrieval for Detecting System Aberration Based on Liquid Crystal Spatial Light Modulator[J]. Laser & Optoelectronics Progress, 2014, 51(8): 80701
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology