Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Laser & Optoelectronics Progress >Volume 52 >Issue 10 >Page 102203 > Article
    • Laser & Optoelectronics Progress
    • Vol. 52, Issue 10, 102203 (2015)
    Discuss and Design of Picosecond Laser Pulse Applied in Long-Distance Ranging
    Kang Minqiang*, Deng Ying, Wang Fang, Li Fuquan..., Zhang Yongliang, Wang Shaoqi and Zhu Qihua|Show fewer author(s)
    Author Affiliations
  • [in Chinese]
    • show less
    DOI: 10.3788/lop52.102203 Cite this Article Set citation alerts
    Kang Minqiang, Deng Ying, Wang Fang, Li Fuquan, Zhang Yongliang, Wang Shaoqi, Zhu Qihua. Discuss and Design of Picosecond Laser Pulse Applied in Long-Distance Ranging[J]. Laser & Optoelectronics Progress, 2015, 52(10): 102203 Copy Citation Text show less
    Cited By
    Article index updated: Mar. 23, 2025
    The article is cited by 3 article(s) CLP online library. (Some content might be in Chinese.)
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (17)
    Cited By (3)
    Get Citation
    Copy Citation Text
    Kang Minqiang, Deng Ying, Wang Fang, Li Fuquan, Zhang Yongliang, Wang Shaoqi, Zhu Qihua. Discuss and Design of Picosecond Laser Pulse Applied in Long-Distance Ranging[J]. Laser & Optoelectronics Progress, 2015, 52(10): 102203
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology