• Optical Instruments
  • Vol. 44, Issue 5, 61 (2022)
Qiukai FENG, Xiao LIU, and Guanjun YOU*
Author Affiliations
  • School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
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    DOI: 10.3969/j.issn.1005-5630.2022.005.008 Cite this Article
    Qiukai FENG, Xiao LIU, Guanjun YOU. Terahertz photoinduced force near-field microscopy and application[J]. Optical Instruments, 2022, 44(5): 61 Copy Citation Text show less
    Schematic diagram of dipole model
    Fig. 1. Schematic diagram of dipole model
    Calculated curve of gradient force varying with probe-sample distance
    Fig. 2. Calculated curve of gradient force varying with probe-sample distance
    Schematic diagram of THz PiFM
    Fig. 3. Schematic diagram of THz PiFM
    Optical micrograph of monolayer MoS2 grains
    Fig. 4. Optical micrograph of monolayer MoS2 grains
    Topography, THz PiFM and THz s-SNOM micrograph of MoS2
    Fig. 5. Topography, THz PiFM and THz s-SNOM micrograph of MoS2
    The height and PiFM signal at the edge of MoS2 under optical excitation
    Fig. 6. The height and PiFM signal at the edge of MoS2 under optical excitation
    Scanning electron microscopy and micro-PL characterizations of MoS2
    Fig. 7. Scanning electron microscopy and micro-PL characterizations of MoS2
    Qiukai FENG, Xiao LIU, Guanjun YOU. Terahertz photoinduced force near-field microscopy and application[J]. Optical Instruments, 2022, 44(5): 61
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