Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Laser & Optoelectronics Progress >Volume 60 >Issue 1 >Page 0130004 > Article
    • Laser & Optoelectronics Progress
    • Vol. 60, Issue 1, 0130004 (2023)
    Nondestructive Detection Model of Hazelnut Protein Based on Near Infrared Spectroscopy
    Dongyan Zhang, Congcong Fu*, Dandan Li, Miaoyuan Ma, and Ying Huang
    Author Affiliations
  • College of Mechanical and Electrical Engineering, Northeast Forestry University, Harbin 150040, Heilongjiang, China
    • show less
    DOI: 10.3788/LOP213222 Cite this Article Set citation alerts
    Dongyan Zhang, Congcong Fu, Dandan Li, Miaoyuan Ma, Ying Huang. Nondestructive Detection Model of Hazelnut Protein Based on Near Infrared Spectroscopy[J]. Laser & Optoelectronics Progress, 2023, 60(1): 0130004 Copy Citation Text show less
    Cited By
    Article index updated: Mar. 29, 2025
    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (14)
    Equations (0)
    References (23)
    Cited By (1)
    Get Citation
    Copy Citation Text
    Dongyan Zhang, Congcong Fu, Dandan Li, Miaoyuan Ma, Ying Huang. Nondestructive Detection Model of Hazelnut Protein Based on Near Infrared Spectroscopy[J]. Laser & Optoelectronics Progress, 2023, 60(1): 0130004
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology