High efficiency X-ray diffraction diagnostic spectrometer with multi-curvature bent crystal

Jun Shi; Tong Yao; Miao Li; Guohong Yang; Minxi Wei; Wanli Shang; Feng Wang

doi:10.3788/COL202018.113401

Journals >Chinese Optics Letters >Volume 18 >Issue 11 >Page 113401 > Article

Chinese Optics Letters
Vol. 18, Issue 11, 113401 (2020)

High efficiency X-ray diffraction diagnostic spectrometer with multi-curvature bent crystal

Jun Shi¹, Tong Yao², Miao Li^2,*, Guohong Yang³..., Minxi Wei³, Wanli Shang³ and Feng Wang³|Show fewer author(s)

Author Affiliations

¹Key Laboratory of Optoelectronic Technology and Systems of the Ministry of Education, Chongqing University, Chongqing 400044, China

²College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China

³Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China

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DOI: 10.3788/COL202018.113401 Cite this Article Set citation alerts

Jun Shi, Tong Yao, Miao Li, Guohong Yang, Minxi Wei, Wanli Shang, Feng Wang, "High efficiency X-ray diffraction diagnostic spectrometer with multi-curvature bent crystal," Chin. Opt. Lett. 18, 113401 (2020) Copy Citation Text

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